Haeruddin, Haeruddin, Franklin Winata, Muhammad Ilham Ashiddiq Tresnawan, Gautama Wijaya, and Heru Wijayanto Aripradono. 2026. “Integrasi Feature Engineering Dan SMOTE Pada Algoritma Random Forest Untuk Prediksi Kerusakan Chip RFID Di Industri Sel Surya”. Journal of Information System Research (JOSH) 7 (2), 599-609. https://doi.org/10.47065/josh.v7i2.9038.